The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jun. 24, 2005
Avery Li-chun Wang, Palo Alto, CA (US);
Avery Li-Chun Wang, Palo Alto, CA (US);
Landmark Digital Services LLC, Nashville, TN (US);
Abstract
A method of characterizing the overlap of two media segments is provided. In an instance where there is some amount of overlap of a file and a data sample, the file could be an excerpt of an original file and begin and end within the data sample. By matching identified features of the file with identified features of the data sample, a beginning and ending time of a portion of the file that is within the data sample can be determined. Using these times, a length of the file within the data sample can also be determined.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile