The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jul. 14, 2004
Applicant:
Necati Gulunay, Missouri City, TX (US);
Inventor:
Necati Gulunay, Missouri City, TX (US);
Assignee:
Compagnie Generale de Geophysique, Massy Cedex, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/00 (2006.01); G01V 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract
Coherency analysis, such as semblance scan or stacking amplitude, is used to locate diffractors. This is done utilizing traces of a recorded 3-D marine survey with one or more cables. Locations of each diffractor are determined by comparing the lateral coherency of the received amplitudes that each assumed diffractor position generates. Once the diffractors are located, noise energy originating from the diffractors is minimized.