The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Oct. 31, 2006
Mattias Rouw, Arnhem, NL;
Patrick Scholten, Zutphen, NL;
Henricus W. M. DE Bruyn, Arnhem, NL;
Medtronic, Inc., Minneapolis, MN (US);
Abstract
Waveform analysis is used to identify and distinguish components of a sensed input signal, such as P-wave and Far Field R-wave signal components present in a sensed cardiac signal, even when the components are so closely spaced in time that the overlap to create a distorted input signal. A set of composite waveforms are generated by superimposing waveform templates of the signal components with different time delays or degree of overlap. Form parameters for each composite waveform are derived and mapped in a multidimensional map, from which form parameter boundaries are derived. Waveform data is collected from an input signal during a sensed event time window, and form parameters for the input signal waveform are derived. An output identifying the signal component of interest (e.g., a P-wave) and its location within the sensed event time window is produced based upon the set of form parameters of the input signal waveform and the form parameter boundaries.