The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Nov. 18, 2003
Mark E. Fauver, Seattle, WA (US);
J. Richard Rahn, Sammamish, WA (US);
Eric J. Seibel, Seattle, WA (US);
Alan C. Nelson, Gig Harbor, WA (US);
Mark E. Fauver, Seattle, WA (US);
J. Richard Rahn, Sammamish, WA (US);
Eric J. Seibel, Seattle, WA (US);
Alan C. Nelson, Gig Harbor, WA (US);
University of Washington, Seattle, WA (US);
VisionGate, Inc., Gig Harbor, WA (US);
Abstract
A system for optical imaging of a thick specimen that permits rapid acquisition of data necessary for tomographic reconstruction of the three-dimensional (3D) image. One method involves the scanning of the focal plane of an imaging system and integrating the range of focal planes onto a detector. The focal plane of an optical imaging system is scanned along the axis perpendicular to said plane through the thickness of a specimen during a single detector exposure. Secondly, methods for reducing light scatter when using illumination point sources are presented. Both approaches yield shadowgrams. This process is repeated from multiple perspectives, either in series using a single illumination/detection subsystem, or in parallel using several illumination/detection subsystems. A set of pseudo-projections is generated, which are input to a three dimensional tomographic image reconstruction algorithm.