The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2010

Filed:

Mar. 04, 2009
Applicants:

John H. Burdett, Jr., Scotia, NY (US);

Adam Bailey, Albany, NY (US);

Zewu Chen, Schenectady, NY (US);

R. Scott Semken, East Greenbush, NY (US);

Kai Xin, Wynantskill, NY (US);

Inventors:

John H. Burdett, Jr., Scotia, NY (US);

Adam Bailey, Albany, NY (US);

Zewu Chen, Schenectady, NY (US);

R. Scott Semken, East Greenbush, NY (US);

Kai Xin, Wynantskill, NY (US);

Assignee:

X-Ray Optical Systems, Inc., East Greenbush, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

An x-ray analysis apparatus for illuminating a sample spot with an x-ray beam. An x-ray tube is provided having a source spot from which a diverging x-ray beam is produced, the source spot requiring alignment along a transmission axis passing through the sample spot. A first housing section is provided, to which the x-ray tube is attached, including mounting features for adjustably mounting the x-ray tube therein such that the source spot coincides with the transmission axis. A second housing section includes a second axis coinciding with the transmission axis; and at least one x-ray optic attached to the second housing section for receiving the diverging x-ray beam and directing the beam toward the sample spot. Complimentary mating surfaces may be provided to align the first and second sections, and the optics, to the transmission axis. A third housing section may also be provided, including an aperture through which the x-ray beam passes, and to which a detector may be attached.


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