The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2010

Filed:

Dec. 02, 2008
Applicants:

Rory D. Delaney, Burnt Hills, NY (US);

Brian W. Gallagher, Guilderland, NY (US);

Inventors:

Rory D. Delaney, Burnt Hills, NY (US);

Brian W. Gallagher, Guilderland, NY (US);

Assignee:

X-Ray Optical Systems, Inc., East Greenbush, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G21K 1/04 (2006.01); H05G 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A shielded sample cell insertion and removal apparatus for an x-ray analysis instrument, including a sample cell setting to hold a sample cell, an outer surface of which exposes the sample to an x-ray engine; and a shielded area positioned over the sample cell, to shield an area beyond the sample cell from x-rays transmitted from the x-ray engine. Upon moving the apparatus into and out of the instrument, the sample cell is moved into and out of an analysis position, while retaining shielding of areas beyond the sample cell from x-rays transmitted from the x-ray engine of the instrument.


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