The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jul. 21, 2006
Ravishankar H. Mahadevappa, Irvine, CA (US);
Stephan Ten Brink, Irvine, CA (US);
Ravishankar H. Mahadevappa, Irvine, CA (US);
Stephan ten Brink, Irvine, CA (US);
Realtek Semiconductor Corp., Hsinchu, TW;
Abstract
A method and system for estimating DC offset and removing the excess DC offset from samples used by an overlap-and-add operation at the receiver of OFDM symbols in UWB communication. The DC offset for each sample within the overlap-and-add interval may be estimated using a sliding window, of the size required for an FFT, operation over past samples. The DC offset may be estimated for a sample within the overlap-and-add interval and updated for the succeeding samples. A size of the overlap-and-add interval may be fixed or may be allowed to vary according to switching characteristics of an analog RF stage preceding the overlap-and-add operation.