The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jan. 10, 2007
Takamasa Kobayashi, Ibaraki, JP;
Masaki Shikami, Ibaraki, JP;
Yasuyuki Mikasa, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;
Abstract
Provided are a layered film defect detection device capable of performing defect detection considering irregularities of optical performance of a phase difference layer constituting the layered film without requiring insertion of a new part into an optical path; and a layered film defect detection method. A defect detection device used for a layered film () having a polarizing plate () and a phase difference layer (separator ()) includes: a light source () arranged at one side of the film surfaces of the layered film (), an imaging unit () arranged on the other side of the film surface; an inspection polarization filter () arranged between the light source () and the imaging unit (); a defect detection unit () for detecting a defect existing on the polarizing plate () according to the captured image; and an optical axis adjusting unit () for adjusting a relative angle position of the polarization axis (L) of a polarizing filter () and a polarization axis (L) of a polarizer (). In the detection device, the relative angle position of the polarizing filter () is adjusted within a range of the polarization axis angle x of the polarizing filter satisfying the relationship 0 degrees<xf 15 degrees so as to minimize the visible light quantity inputted to the imaging unit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile