The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Feb. 05, 2008
Yin-long Luo, Hang-Zhou, CN;
Song LI, Hang-Zhou, CN;
Jun Wang, Hang-Zhou, CN;
Asia Optical Co., Inc., Taichung, TW;
Abstract
A distant measurement method and a distant measurement system are provided. The distant measurement method includes the following steps: emitting a first light beam and a second light beam from an emitting terminal, wherein the first light beam travels toward a target; providing a switching sequence by a switch mechanism; placing a receiving terminal to receive the first light beam reflected from the target in accordance with the switching sequence and correspondingly provide a first electrical signal, and to receive the second light beam and correspondingly provide a second electrical signal; and utilizing a controlling terminal to receive the first and second electrical signals, and calculate distance between the distant measurement system and the target in accordance with a phase differential formed between the first and second electrical signals.