The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
May. 01, 2006
Mark Damon Wheeler, San Ramon, CA (US);
Jonathan Apollo Kung, San Francisco, CA (US);
Richard William Bukowski, Orinda, CA (US);
Mark Damon Wheeler, San Ramon, CA (US);
Jonathan Apollo Kung, San Francisco, CA (US);
Richard William Bukowski, Orinda, CA (US);
Leica Geosystems AG, Heerbrugg, CH;
Abstract
A method relating to a point cloud includes defining a line of sight of a point cloud on a display of a computer, estimating a normal vector for at least one point of the plurality of points, and determining the appearance on the display of at least one point of the plurality of points based on the step of estimating a normal vector. One can use the computer to manipulate the point cloud to display a selected view of the scene and calculate the angle between the normal vector of the at least one point and a line of sight. The step of determining the appearance can include determining the transparency, color or size of the point on the display according to the angle between the normal vector and the line of sight.