The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Sep. 08, 2005
Russell W. Gruhlke, Fort Collins, CO (US);
Rene P. Helbing, Palo Alto, CA (US);
Susan Hunter, Fort Collins, CO (US);
Russell W. Gruhlke, Fort Collins, CO (US);
Rene P. Helbing, Palo Alto, CA (US);
Susan Hunter, Fort Collins, CO (US);
Avago Technologies ECBU IP (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A detection system. The detection system includes a substrate, a laser, and a sensor array. The substrate includes a first surface, a second surface conceptually divided into multiple areas, and a third surface. The laser is configured to emit electromagnetic radiation into the substrate and incident subsequently onto second surface areas. The sensor array is configured to capture electromagnetic radiation reflected from the second surface. If a first dielectric, having first dielectric constant, is in contact with some areas, electromagnetic radiation incident thereon experiences total internal reflection and if a second dielectric having second dielectric constant is in contact with other areas, some of the electromagnetic radiation incident thereon is reflected back into the substrate by the second dielectric. The sensor array is configured to detect laser speckle originating from the incidence of the electromagnetic radiation at the second surface and to detect electromagnetic radiation reflected from the second dielectric.