The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2010

Filed:

Sep. 26, 2007
Applicants:

Eddie L Williamson, Fort Collins, CO (US);

Tak Yee Kwan, Mississauga, CA;

Inventors:

Eddie L Williamson, Fort Collins, CO (US);

Tak Yee Kwan, Mississauga, CA;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/04 (2006.01); G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for verifying the integrity of the electrical connection between at least one signal path of a substrate and at least one respective contact of a component mounted on the substrate is disclosed. The method includes generating a step signal on one of the at least one signal path connected to a respective contact, and capturing a capacitively coupled signal due to the step signal at the contact. The method further includes determining the integrity of the electrical connection from a characteristic of the capacitively coupled signal or a response signal obtained from the capacitively coupled signal. A tester in which the method is implemented is also disclosed.


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