The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Aug. 26, 2008
Rex E. Gerald, Ii, Brookfield, IL (US);
Robert J. Klingler, Glenview, IL (US);
Jerome W. Rathke, Homer Glen, IL (US);
Rocio Diaz, Chicago, IL (US);
Lela Vukovic, Westchester, IL (US);
Rex E. Gerald, II, Brookfield, IL (US);
Robert J. Klingler, Glenview, IL (US);
Jerome W. Rathke, Homer Glen, IL (US);
Rocio Diaz, Chicago, IL (US);
Lela Vukovic, Westchester, IL (US);
The University of Chicago, Chicago, IL (US);
Abstract
A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.