The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2010
Filed:
Jan. 25, 2008
Otto Gaa, Worms, DE;
Gertrud Albrecht, Mannheim, DE;
Dieter Loch-leroux, Carlsberg, DE;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
The present invention pertains to a method for verifying usability of a test element on the basis of the relation of at least one control parameter measurable from the blank test field of a test element to a standard value for the at least one control parameter. In one embodiment, the method comprises determining the deviation between a first ratio calculated from a blank-field reference value measured for the control parameter and a first standard value, and a second ratio calculated from a blank-field control value and the first standard value, and rejecting a test element if the deviation is not within a predetermined tolerance range for the deviation.