The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 15, 2010

Filed:

Jul. 14, 2005
Applicants:

Masaya Nakatani, Hyogo, JP;

Nobuhiko Ozaki, Nara, JP;

Hiroaki Oka, Osaka, JP;

Inventors:

Masaya Nakatani, Hyogo, JP;

Nobuhiko Ozaki, Nara, JP;

Hiroaki Oka, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe for measuring an electric potential of a cell includes a plate having a surface having a first cavity provided therein, and a sensor element provided in the first cavity. A second cavity is provided in the bottomsurface of the first cavity. The first flow passage having first and second openings is provided in the plate. The first and second openings of the first flow passage open to the second cavity and outside the plate, respectively. The sensor element includes a thin plate, and a supporting substrate provided around the thin plate and in the first cavity of the plate. The thin plate has a through-hole therein having a first opening and a second opening communicating with the second cavity of the plate. The first flow passage allows fluid to flow therein. A sucking device is coupled with the second opening of the first flow passage as to suck the fluid flowing in the first flow passage. This probe can measure an electric potential of a cell floating in solution as it is in this environment.


Find Patent Forward Citations

Loading…