The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Oct. 10, 2006
Applicants:

Sungho Jin, San Diego, CA (US);

Li-han Chen, San Diego, CA (US);

I-chen Chen, San Diego, CA (US);

Inventors:

Sungho Jin, San Diego, CA (US);

Li-Han Chen, San Diego, CA (US);

I-Chen Chen, San Diego, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate (in FIG.()), depositing a carbon dot (in FIG.()) on the catalyst metal film, etching away the catalyst metal film (FIG.()) not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film (FIG.()), and growing a carbon nanotube probe tip on the catalyst film (in FIG.()). The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.


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