The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Oct. 02, 2006
Dong-ho Kim, Seoul, KR;
Yung-soo Kim, Seongnam-si, KR;
Ye-hoon Lee, Suwon-si, KR;
Myeon-gyun Cho, Seongnam-si, KR;
Hyo-yol Park, Seoul, KR;
Keum-chan Whang, Seoul, KR;
Kwang-soon Kim, Seoul, KR;
Jae-won Kang, Daegu, KR;
Dong-Ho Kim, Seoul, KR;
Yung-Soo Kim, Seongnam-si, KR;
Ye-Hoon Lee, Suwon-si, KR;
Myeon-Gyun Cho, Seongnam-si, KR;
Hyo-Yol Park, Seoul, KR;
Keum-Chan Whang, Seoul, KR;
Kwang-Soon Kim, Seoul, KR;
Jae-Won Kang, Daegu, KR;
Samsung Electronics Co., Ltd, , KR;
Yonsei University, , KR;
Abstract
A method for puncturing a Low Density Parity Check (LDPC). The method includes a) setting a codeword length and the total number of bit nodes to be punctured; b) selecting a check node (or check nodes) with highest priority excluding check nodes completely checked in a current round; c) selecting a bit node (or bit nodes) with a highest priority excluding bit nodes completely checked among bit nodes connected to the selected check node (or check nodes); d) determining whether the selected bit node is a bit node to be punctured, that is, it is not systematic, not set by a puncturing prohibition flag; e) puncturing an associated bit node if the selected bit node is the bit node to be punctured, setting unpunctured bit nodes connected to the selected check node by a puncturing prohibition flag, decreasing the number of remained bit nodes to be punctured by 1 and increasing the number of connected punctured node of associated check node by 1; f) determining whether the number of remaining bits to be punctured is greater than 0; and g) returning to step b) if the number of remaining bits to be punctured is greater than 0, and ending a puncturing process if the number of remaining bits to be punctured is not greater than 0.