The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Jun. 27, 2006
Jonathan Y. Chen, Marlboro, NY (US);
Jeffrey A. Magee, Poughkeepsie, NY (US);
David A. Webber, Poughkeepsie, NY (US);
Jonathan Y. Chen, Marlboro, NY (US);
Jeffrey A. Magee, Poughkeepsie, NY (US);
David A. Webber, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A double data rate launch system and method in which the two-to-one multiplexer select signal delay is programmable and can be adjusted individually for each system. This allows the amount of delay to be minimized based on the actual set up time required, not the worst-case set-up time. The select signal to the multiplexer is delayed sufficiently to compensate for non-uniformity of duty cycle of data at the inputs to the multiplexer. Compensation of the non-uniformity allows the data on the wire to have a uniform duty cycle for all data transferred regardless of which latch is sourcing the data. The multiplexer that selects data from the two latches which are launching data on the edge of different clocks has a select line that is delayed by a variable amount to tune the select such that the data is clean at the input to the multiplexer on all ports.