The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Oct. 18, 2007
Applicants:

Tie-yan Liu, Beijing, CN;

Hang LI, Beijing, CN;

Tao Qin, Beijing, CN;

Zhe Cao, Beijing, CN;

Inventors:

Tie-Yan Liu, Beijing, CN;

Hang Li, Beijing, CN;

Tao Qin, Beijing, CN;

Zhe Cao, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Procedures for learning and ranking items in a listwise manner are discussed. A listwise methodology may consider a ranked list, of individual items, as a specific permutation of the items being ranked. In implementations, a listwise loss function may be used in ranking items. A listwise loss function may be a metric which reflects the departure or disorder from an exemplary ranking for one or more sample listwise rankings used in learning. In this manner, the loss function may approximate the exemplary ranking for the plurality of items being ranked.


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