The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Oct. 18, 2006
Applicants:

J. Ward Macarthur, Scottsdale, AZ (US);

Wendy K. Foslien, Minneapolis, MN (US);

Dinkar Mylaraswamy, Fridley, MN (US);

Mohan N. Srinivasrao, Bangalore, IN;

Inventors:

J. Ward MacArthur, Scottsdale, AZ (US);

Wendy K. Foslien, Minneapolis, MN (US);

Dinkar Mylaraswamy, Fridley, MN (US);

Mohan N. Srinivasrao, Bangalore, IN;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Various methods, devices, systems, and computer programs are disclosed relating to the use of models to represent systems and processes (such as manufacturing and production plants). For example, a method may include generating a first model and a second model using operating data associated with a system or process. The method may also include using the first and second models to predict one or more events associated with the system or process. The one or more events are predicted by generating one or more initial event predictions using the first model and adjusting the one or more initial event predictions using the second model. The first model may represent a Principal Component Analysis (PCA) model, and the second model may represent a Fuzzy Logic model.


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