The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Nov. 27, 2006
Yoshiyuki Shirakawa, Chiba, JP;
Yusuke Kobayashi, Mitaka, JP;
Toshiya Yamano, Mitaka, JP;
National Institute of Radiological Science, Chiba, JP;
Aloka Co., Ltd., Tokyo, JP;
Abstract
A radiation measuring device capable of identifying the incident direction of a radiation ray and energy (segmentation). The directivity characteristics of a plurality of detectors are different from each other. A plurality of energy segmentations are set respectively for a plurality of spectra corresponding to a plurality of detectors, and actual measurement ratio information (a plurality of actual measurement counting ratios) expressing the mutual ratio between integrated counting values for each energy segmentation is computed. The actual measurement ratio information is checked against a plurality of response functions, and, when the compatibility relation between specific actual measurement ratio information and specific theoretical ratio information is found, the incident direction of a radiation ray and an energy segmentation are identified based on that relation.