The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Apr. 11, 2007
Saïd Labreche, Buzet sur Tarn, FR;
Hicham Amine, Dieupentale, FR;
François Loubet, Gardouch, FR;
Eric Chanie, Deyme, FR;
Jean-christophe Mifsud, Toulouse, FR;
Saïd Labreche, Buzet sur Tarn, FR;
Hicham Amine, Dieupentale, FR;
François Loubet, Gardouch, FR;
Eric Chanie, Deyme, FR;
Jean-Christophe Mifsud, Toulouse, FR;
Alpha M.O.S., Toulouse, FR;
Abstract
The comparative analysis of a sample, derived from a product, with respect to a database comprises the step of determining the class membership of the different characteristics (variables) describing the samples: whether they are characteristics common to the sample under test and the database, they are characteristics particular to the sample under test, or they are characteristics particular to the database. The assignment of the variables to these classes enables parameters to be defined for global comparison of the sample under test and the database, based on: ratios summarizing the values taken by the variables of the different classes, or the distribution of the variables of the different classes. A machine implementation of the analysis is described.