The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Oct. 15, 2007
Lawrence E. Pado, Saint Charles, MO (US);
Lawrence E. Pado, Saint Charles, MO (US);
Boeing Company, Chicago, IL (US);
Abstract
A method for creating at least one input parameter for an algorithmic system to evaluate damage in a structure may include: (a) Determining a plurality of damage index factors using first signal information relating to a first signal transmitted through the structure before the damage is imposed, and second signal information relating to a second signal transmitted through the structure after the damage is imposed. (b) determining a plurality of condensed damage index factors using the plurality of damage index factors. (c) Correlating selected of the condensed damage index factors with selected measured dimensions relating to the damage to determine a correlation index for selected combinations of the condensed damage index factors and the dimensions. (d) Selecting the at least one input parameter from among the selected condensed damage index factors having a correlation index meeting at least one predetermined criterion.