The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Mar. 05, 2008
Applicants:

Toshimitsu Musha, Yokohama, JP;

Haruyasu Matsuzaki, Edogawa, JP;

Inventors:

Toshimitsu Musha, Yokohama, JP;

Haruyasu Matsuzaki, Edogawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

For measuring a brain local activity, a predetermined frequency bandwidth wider than a frequency bandwidth of alpha waves of scalp potentials is divided into a predetermined number of frequency banks each having a fixed frequency width, data of each divided frequency bank is divided into segments of a predetermined duration on a time axis, a Z-score of the subject is determined from a first mean value of normalized power variances determined for the segments and a second mean value of normalized power variances predetermined in the same manner as the first mean value for a predetermined normal person group and a standard deviation of the normalized power variances in the group, and a mean value of the Z-scores determined over all of the frequency banks is mapped on a brain surface for each sensor, whereby a template of a specified brain disorder and likelihood of a subject to a specified brain disorder are calculated.


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