The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Mar. 22, 2007
Naoki Mizutani, Nagano, JP;
Kunihiko Kanai, Nagano, JP;
Yuji Shibata, Nagano, JP;
Masao Harada, Nagano, JP;
Naoki Mizutani, Nagano, JP;
Kunihiko Kanai, Nagano, JP;
Yuji Shibata, Nagano, JP;
Masao Harada, Nagano, JP;
Eastman Kodak Company, Rochester, NY (US);
Abstract
When focus adjustment operation is performed, a first measured distance acquired by utilization of TTL-AF and a second measured value acquired by utilization of a distance between the eyes have been computed in advance. The degree of reliability of the first measured distance is compared the degree of reliability of the second measured distance in accordance with a result of a determination as to whether or not a face is detected, a result of a determination as to whether or not an ambient brightness value Br is equal to or less than a reference value, a result of a determination as to whether or not a focal length 'f' is equal to or less than a reference value, and a result of a determination as to whether or not a second measured distance De is less than a first measured distance Dt.