The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Feb. 02, 2007
Applicants:

Tetsujiro Kondo, Tokyo, JP;

Junichi Ishibashi, Saitama, JP;

Takashi Sawao, Tokyo, JP;

Takahiro Nagano, Kanagawa, JP;

Naoki Fujiwara, Tokyo, JP;

Toru Miyake, Tokyo, JP;

Seiji Wada, Kanagawa, JP;

Inventors:

Tetsujiro Kondo, Tokyo, JP;

Junichi Ishibashi, Saitama, JP;

Takashi Sawao, Tokyo, JP;

Takahiro Nagano, Kanagawa, JP;

Naoki Fujiwara, Tokyo, JP;

Toru Miyake, Tokyo, JP;

Seiji Wada, Kanagawa, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image processing device and method, where the device includes a data continuity detector configured to detect data continuity of image data made up of a plurality of pixels acquired by light signals of a real world being cast upon a plurality of detecting elements each having spatio-temporal integration effects, and a real world estimating unit configured to generate a gradient of pixel values of the plurality of pixels corresponding to a position in one dimensional direction of spatio-temporal directions as to pixels of interest within the image data.


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