The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Jun. 22, 2005
Jiang Hsieh, Brookfield, WI (US);
Fang Frank Dong, New Berlin, WI (US);
Thomas John Myers, Wauwatosa, WI (US);
George Seidenschnur, Waukesha, WI (US);
Anne Marie Conry, Wauwatosa, WI (US);
Zachary William Sopcak, Milwaukee, WI (US);
Brian Grekowicz, Salt Lake City, UT (US);
Jiang Hsieh, Brookfield, WI (US);
Fang Frank Dong, New Berlin, WI (US);
Thomas John Myers, Wauwatosa, WI (US);
George Seidenschnur, Waukesha, WI (US);
Anne Marie Conry, Wauwatosa, WI (US);
Zachary William Sopcak, Milwaukee, WI (US);
Brian Grekowicz, Salt Lake City, UT (US);
General Electric Company, Schenectady, NY (US);
Abstract
Methods and apparatus for producing an image of an object with a multi-slice imaging apparatus having a row of detectors are provided. The method includes generating a first partial image using projection data acquired at a first imaging position in a step-and-shoot imaging mode, generating a second partial image using projection data acquired at a second imaging position, and combining the partial images to form a final image.