The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Nov. 28, 2006
Applicants:

Yoon Seop Chang, Daejeon, KR;

Kyung OK Kim, Daejeon, KR;

Sung Woong Shin, Daejeon, KR;

Inventors:

Yoon Seop Chang, Daejeon, KR;

Kyung Ok Kim, Daejeon, KR;

Sung Woong Shin, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G09G 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a method and apparatus for classifying geological materials using image processing techniques. The method and apparatus classify geological materials including stones, rock samples, and rock surfaces according to type and state by sequentially applying image processing techniques, such as a color space analysis, a granulometry analysis, texture parameter extraction and texture statistics extraction, to digital images of the geological materials. Since the method and apparatus extract quantitative figures that represent an entire image region by applying various image processing techniques, such as the color space analysis, the granulometry, the texture parameter extraction and the texture statistics extraction, to the digital images of the geological materials, the geological materials can be classified, which is not possible using a conventional image processing technique.


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