The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Apr. 27, 2006
Measuring method and system for measuring particle size and shape of powdery or grain like particles
Applicants:
Niklas Sandler, Helsinki, FI;
Osmo Antikainen, Helsinki, FI;
Jouko Yliruusi, Vantaa, FI;
Inventors:
Assignee:
Intelligent Pharmaceutics Ltd Oy, Helsinki, FI;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a measuring method for measuring the properties of a powder or granular sample () from the surface information of the sample. According to the method the sample is leveled for the measurement, at least one image of the surface of the sample () is taken and the properties, such as the grain-size distribution, of the sample () are determined by processing the information material by calculation. According to the invention, the sample () is made to be supported on a transparent sample plate () and an image is taken through this sample plate ().