The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Feb. 19, 2008
Tadashi Kajino, Okazaki, JP;
Tadashi Kajino, Okazaki, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
A lens meter capable of obtaining optical characteristics of a lens with high stability and accuracy has a measurement optical system including a target panel having measurement targets having first measurement targets and second measurement targets and a photodetector which photo-receives a measurement light bundle, a calculation means which calculates the optical characteristics including first calculation means which calculates first optical characteristics based on a detection result of the first measurement targets by the photodetector and second calculation means which calculates second optical characteristics based on a detection result of the first and second measurement targets, and display control means which displays the second optical characteristics as the optical characteristics of the lens if the calculation result by the first calculation means or the detection result by the photodetector satisfies a predetermined condition and displays the first optical characteristics if the predetermined condition is not satisfied.