The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Oct. 15, 2007
Applicants:

Alexander Beltran Bernardo, San Antonio, TX (US);

Gary Lane Burkhardt, Adkins, TX (US);

Arthur Edwin Nicholls, Helotes, TX (US);

Walter Mac Gray, San Antonio, TX (US);

Inventors:

Alexander Beltran Bernardo, San Antonio, TX (US);

Gary Lane Burkhardt, Adkins, TX (US);

Arthur Edwin Nicholls, Helotes, TX (US);

Walter Mac Gray, San Antonio, TX (US);

Assignee:

Southwest Research Institute, San Antonio, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/08 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for measuring radial strain on powder or other granular material while the powder is subject to compressive axial and radial loading. The powder is contained within a pliable sleeve. As pressure is applied to the powder, the sleeve changes diameter. An optical emitter emits a beam of light, which is intersected by the entire diameter of the sleeve. An optical sensor receives the intersected beam, and generates a response signal that indicates the diameter of the sleeve. This change in diameter can be related to a constitutive property such as strain.


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