The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Nov. 06, 2006
Taejung Kim, Incheon, KR;
Tae-yoon Lee, Incheon, KR;
Taejung Kim, Incheon, KR;
Tae-Yoon Lee, Incheon, KR;
INHA-Industry Partnership Institute, Inchon, KR;
Abstract
Disclosed herein is a method of extracting three-dimensional building information using shadow analysis. In the method, an image of a building captured through a manmade satellite, an airplane or some other means, and metadata to be used for extraction of building information is received, the azimuth and altitude angles of a sun in an area of capture, and the azimuth and altitude angles of a camera are calculated. The contour of the roof of the building, the location and height of which are desired to be obtained, is extracted from the image. A height value is assigned to the extracted contour of the roof of the building, and the height value is adjusted until the assigned height value satisfies a predetermined condition. The vertical line and shadow of the building, which are based on the height value, is projected onto the image. The location of the building is extracted using the height value and vertical line of the building if the location of the projected shadow coincides with the location of the shadow of the building.