The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
May. 23, 2008
Yupeng Chen, Beijing, CN;
Zhenhuan Tian, Beijing, CN;
Kiyoung Kwon, Beijing, CN;
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Abstract
The present invention relates to a substrate testing circuit comprising a testing bus and a testing signal terminal connected to the testing bus, a signal line to be tested in the substrate being connected to the testing bus via a signal connecting terminal, wherein a plurality of signal access terminals are provided on the testing bus; one testing branch is connected between each the signal access terminal and the testing signal terminal; and resistance values of the testing branches are the same. By means of the present invention, since a plurality of signal access terminals are introduced and the testing branches with the same resistance are added so that input resistances and impedances of testing signals across the display screen are substantially identical without making changes to process flow and device hardware structure, input resistances and impedances of respective signal lines are well averaged, thereby no obvious regional attenuation occurs in the testing signals within the pixel area to be tested irrespective of limitation in size of panel, so as to realize tests for panels with greater sizes.