The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Jul. 16, 2008
Applicants:

Satoshi Kishimoto, Osaka, JP;

Tomohiko Kanemitsu, Osaka, JP;

Inventors:

Satoshi Kishimoto, Osaka, JP;

Tomohiko Kanemitsu, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor testing circuit of the present invention includes a signal line which is connected to a terminal not to be tested and a plurality of terminals to be tested of a semiconductor device; switch circuits for controlling electrical connection/disconnection between the signal line and the terminals to be tested; and a resistor connected to one end of the signal line. With this configuration, in a test on the AC characteristics of an input signal, a test signal generated by an LSI tester can be inputted to the terminals to be tested through the terminal not to be tested and the signal line by turning on the switch circuits.


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