The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Jul. 16, 2008
Eric Pearson, Consestogo, CA;
Mark R. Hansen, Wauwatosa, WI (US);
Bradly S. Moersfelder, Waukesha, WI (US);
Patrick James Noffke, Devon Park, AU;
John C. Seymour, Genesee Depot, WI (US);
Eric Pearson, Consestogo, CA;
Mark R. Hansen, Wauwatosa, WI (US);
Bradly S. Moersfelder, Waukesha, WI (US);
Patrick James Noffke, Devon Park, AU;
John C. Seymour, Genesee Depot, WI (US);
Quad/Tech, Inc., Sussex, WI (US);
Abstract
An inspection system for inspecting an imprinted substrate on a printing press has a light source, a contact image sensor, and a processor. The light source is configured to illuminate a portion of the substrate which has been imprinted with different colors at a plurality of printing units of the printing press. The contact image sensor has a plurality of sensing elements. Each sensing element senses light reflected by a corresponding region on the substrate to produce data representative of the corresponding region printed on the substrate. The processor is configured to receive the data representative of the imprinted substrate and to compare the data representative of the corresponding region printed on the substrate with stored reference data.