The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
May. 30, 2008
Naoto Honda, Okazaki, JP;
Naoto Honda, Okazaki, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An ophthalmic apparatus capable of performing alignment of the apparatus with respect to an examinee's eye with ease regardless of characteristics of the eye or an environment of the apparatus includes a measurement unit performing examination/measurement of the eye, a projection optical system for projecting an alignment target onto an anterior segment of the eye, an image-pickup optical system for picking up an anterior-segment image with an image of the projected target by a two-dimensional image-pickup element, and a calculation and control unit detecting the target image, and based on the detection result, detecting an alignment condition of the measurement unit with the eye, wherein the calculation and control unit detects two-dimensional luminance distribution in an image obtained by the element, and based on the detection result, changes projection light intensity of light of the target and/or gain of the element so that the target image becomes detectable.