The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 2010
Filed:
Dec. 18, 2007
Frank Kassubek, Rheinfelden, DE;
Lothar Deppe, Göttingen, DE;
Jörg Gebhardt, Mainz, DE;
René Friedrichs, Rosdorf, DE;
Steffen Keller, Constance, DE;
Frank Kassubek, Rheinfelden, DE;
Lothar Deppe, Göttingen, DE;
Jörg Gebhardt, Mainz, DE;
René Friedrichs, Rosdorf, DE;
Steffen Keller, Constance, DE;
ABB Patent GmbH, Ladenburg, DE;
Abstract
A method for compensation for influences, which interfere with the measurement accuracy, in measurement devices of the vibration type, comprising a measurement tube through which a fluid medium can flow and which is caused to oscillate mechanically, acting as an oscillation body, by an excitation unit, whose oscillation behavior, which changes as a function of the flowrate and/or the viscosity and/or the density of the fluid medium, is detected by at least one oscillation sensor in order to determine the flowrate, wherein the material strain in the measurement tube is detected by means of at least one sensor, from which an indicator value for the influence causing the material strain is calculated in order to correct the measurement signal, by signal processing, from the indicator value obtained in this way.