The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Nov. 06, 2008
Applicants:

Swee Tiong Tan, Singapore, SG;

Chung Poh Ong, Singapore, SG;

Shang Jiun Wong, Singapore, SG;

Kee Ann Chan, Singapore, SG;

Cheng Siong Chin, Singapore, SG;

Inventors:

Swee Tiong Tan, Singapore, SG;

Chung Poh Ong, Singapore, SG;

Shang Jiun Wong, Singapore, SG;

Kee Ann Chan, Singapore, SG;

Cheng Siong Chin, Singapore, SG;

Assignee:

Seagate Technology LLC, Scotts Valley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01); G01N 3/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test device comprises a base and a first fixture coupled to the base. The first fixture holds a first portion of an electronic device mounted in the test device. The test device includes a second fixture rotatably coupled to the base and a lever coupled to the second fixture. The second fixture holds a second portion of the electronic device mounted in the test device. The test device also includes an actuator that forcibly moves the lever to rotate the second fixture and apply a torsion stress on the electronic device mounted in the test device. The test device may be used to test the functionality of electronic devices, such as small form-factor disc drives, while under torsion stresses.


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