The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Dec. 16, 2005
Applicants:

Herbert Schroth, Schopfheim, DE;

Andreas Mayr, Lörrach, DE;

Manfred Hammer, Wehr, DE;

Inventors:

Herbert Schroth, Schopfheim, DE;

Andreas Mayr, Lörrach, DE;

Manfred Hammer, Wehr, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for checking proper functioning of a fill-level measuring device working according to the travel time principle. For this purpose, in predetermined or selectable time intervals (ta), a current measured value curve at a current fill level (hactual) is ascertained; on the basis of the current measured value curve, a current wanted echo signal is determined. Subsequently, on the basis of the current wanted echo signal, an expected value (E) for quality of a wanted echo signal at least one predetermined fill level (hdesired) is ascertained. The ascertained expected value (E) for quality of the wanted echo signal at the predetermined fill level (hdesired) is compared with a predetermined critical value for quality, and an error condition is diagnosed, when the ascertained expected value falls below the critical value for quality.


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