The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 08, 2010

Filed:

Jan. 11, 2006
Applicants:

Michio Kadota, Kyoto, JP;

Takeshi Nakao, Nagaokakyo, JP;

Masakazu Mimura, Nagaokakyo, JP;

Inventors:

Michio Kadota, Kyoto, JP;

Takeshi Nakao, Nagaokakyo, JP;

Masakazu Mimura, Nagaokakyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 41/22 (2006.01); H01L 41/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a surface acoustic wave device having a high electromechanical coefficient and reflection coefficient, and also having an improved frequency-temperature characteristic is achieved by forming a SiOfilm on an IDT so as to prevent cracking from occurring on a surface of the SiOfilm so that desired properties can be reliably obtained. The surface acoustic wave device includes at least one IDT, which is composed of a metal or an alloy having a density higher than that of Al and is formed on a 25° to 55° rotation-Y plate X propagation LiTaOsubstrate, and a SiOfilm disposed on the LiTaOsubstrate so as to cover the at least one IDT for improving the frequency-temperature characteristic.


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