The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Dec. 17, 2003
John T. Chamberlain, Medford, MA (US);
Joann Jordan, North Reading, MA (US);
John T. Chamberlain, Medford, MA (US);
Joann Jordan, North Reading, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
The present invention is a system for efficiently generating test cases characterized by a linear range of integral values. A software testing tool which has been configured to generate test cases characterized by a linear range of integral values in accordance with the present invention can include a user interface coupled to a test case generator. The test case generator can be configured for range bounding for a range of integral values in a software application under test. In particular, the test case generator can include a halving module programmed to identify changes in response states in the software application under test evoked from input tokens having selected ones of the lengths defined within sub-ranges of a specified range of integral values.