The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Oct. 14, 2003
Takeshi Yokota, Tokyo, JP;
Hisanori Nonaka, Tokyo, JP;
Kenji Araki, Tokyo, JP;
Youichi Nishikawa, Tokyo, JP;
Makoto Kudoh, Tokyo, JP;
Takeshi Yokota, Tokyo, JP;
Hisanori Nonaka, Tokyo, JP;
Kenji Araki, Tokyo, JP;
Youichi Nishikawa, Tokyo, JP;
Makoto Kudoh, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Plant Engineering & Construction Co., Ltd., Tokyo, JP;
Abstract
A computer readable storage medium encoded with a project assessment program for assessing a project including a plurality of processes when executed by a computer computing forecasts of the project based on a set of information. At least one scheme by a user input is selected from a group of schemes including an estimation of mutual-correlation of estimated value pattern. Process planning information, up-to-date actual process information and forecast model information of each process included in the project is retrieved. The forecast model information of each process of the project is defined as probability distribution variations of a plurality of parameters of the processes, wherein the probability distribution variations are quantitative values of the project. Estimated values of variations in at least two parameters of the processes using the process planning information, the up-to-date actual process information and the forecast model information are computed.