The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Oct. 29, 2007
Timothy J. Kostyk, Louisville, KY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Jeff R. Layton, New York, NY (US);
Peter Kenneth Malkin, Ardsley, NY (US);
Stephen G. Perun, Evans, GA (US);
Kenneth L. Pyra, Cave Creek, AZ (US);
Padmanabhan Santhanam, Yorktown Heights, NY (US);
John C. Thomas, Yorktown Heights, NY (US);
Scott W. Weller, Penfield, NY (US);
Timothy J. Kostyk, Louisville, KY (US);
Theresa C. Kratschmer, Yorktown Heights, NY (US);
Jeff R. Layton, New York, NY (US);
Peter Kenneth Malkin, Ardsley, NY (US);
Stephen G. Perun, Evans, GA (US);
Kenneth L. Pyra, Cave Creek, AZ (US);
Padmanabhan Santhanam, Yorktown Heights, NY (US);
John C. Thomas, Yorktown Heights, NY (US);
Scott W. Weller, Penfield, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method of optimizing a design of a product in a mass manufacturing process includes steps of: collecting error data relating to a product; classifying the error data into categories of errors to provide classifier error data; analyzing relationships among the classified error data; producing an analysis report; and recommending modifications to an end user for the design of the product.