The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Oct. 06, 2004
Applicants:

Shinichi Eguchi, Inagi, JP;

Naoko Suzuki, Inagi, JP;

Yutaka Katsumata, Inagi, JP;

Kouichi Kanamoto, Inagi, JP;

Inventors:

Shinichi Eguchi, Inagi, JP;

Naoko Suzuki, Inagi, JP;

Yutaka Katsumata, Inagi, JP;

Kouichi Kanamoto, Inagi, JP;

Assignees:

Fujitsu Limited, Kawasaki, JP;

Fujitsu Frontech Limited, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An edge detecting method detects edge segments by searching all of the search lines forming an image from an end of the image in a direction perpendicular to the edges. If a line whose edge segment cannot be detected exists, a search is made in all of the search lines from the vicinity of the center of the image toward the end of the image, whereby edge segments are detected. A linear edge is determined from edge segments. A plurality of edge candidates are obtained from the edge segments for all of the search lines, and an optimum candidate is selected from among the edge candidates. Ruled lines are extracted from the source document in the image, and an optimum candidate is selected based on a comparison with a ruled line. As a result, an edge of the source document can be detected with high accuracy even if an image on a background side is unstable, or if materials of the background and the source document are similar.


Find Patent Forward Citations

Loading…