The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Nov. 26, 2008
John H. Burdett, Jr., Charlton, NY (US);
Daniel L. Dunham, Averill Park, NY (US);
James B. Quinn, Ravena, NY (US);
John H. Burdett, Jr., Charlton, NY (US);
Daniel L. Dunham, Averill Park, NY (US);
James B. Quinn, Ravena, NY (US);
X-Ray Optical Systems, Inc., Armonk, NY (US);
Abstract
A sample cell for an analysis instrument, having an outer body forming a sample reservoir therein; a directional fill valve disposed in an upper end of the outer body and forming an upper end of the sample reservoir, the fill valve for accepting a sample during filling, and preventing sample leakage while providing venting after filling; and a film covering a lower end of the outer body, and forming a bottom end of the sample reservoir, the film for presenting the sample to an analysis focal spot of the analysis instrument. The disclosed sample cell is especially suited for an x-ray analysis engine having a focal spot requiring alignment with the sample in the sample cell. At least one x-ray optic may be disposed in an excitation and/or detection path, requiring alignment to the focal spot, in e.g., a WDXRF or EDXRF system.