The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Sep. 15, 2006
Kazunori Tokiwa, Tokyo-to, JP;
Hideharu Eguchi, Kanagawa-ken, JP;
Toshiyuki Kato, Kanagawa-ken, JP;
Hiroshi Tabata, Ibaraki-ken, JP;
Yasuhiko Teranishi, Kanagawa-ken, JP;
Kazunori Tokiwa, Tokyo-to, JP;
Hideharu Eguchi, Kanagawa-ken, JP;
Toshiyuki Kato, Kanagawa-ken, JP;
Hiroshi Tabata, Ibaraki-ken, JP;
Yasuhiko Teranishi, Kanagawa-ken, JP;
Victor Company of Japan, Ltd., Yokohama, JP;
Abstract
Test signals are recorded on a prescribed area in an optical disc. The prescribed area is scanned by a laser beam while the power of the laser beam is changed among different DC erasing values. The different DC erasing values are assigned to the recorded test signals, respectively. The recorded test signals are reproduced from the prescribed area to obtain reproduced signals. Parameter values of the respective reproduced signals are detected. The detected parameter values correspond to the different DC erasing values, respectively. Among the detected parameter values, a detected parameter value is decided which matches a target. One corresponding to the decided parameter value is selected from the different DC erasing values. A prescribed coefficient and the selected DC erasing value are multiplied to calculate an optimum level of an erasing power of the laser beam.