The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Jul. 01, 2004
Applicants:

Shinichi Eguchi, Tokyo, JP;

Kouichi Kanamoto, Tokyo, JP;

Naoko Suzuki, Tokyo, JP;

Yutaka Katsumata, Tokyo, JP;

Inventors:

Shinichi Eguchi, Tokyo, JP;

Kouichi Kanamoto, Tokyo, JP;

Naoko Suzuki, Tokyo, JP;

Yutaka Katsumata, Tokyo, JP;

Assignees:

Fujitsu Limited, Kawasaki, JP;

Fujitsu Frontech Limited, Inagi-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/46 (2006.01); H04N 1/60 (2006.01); G06F 15/00 (2006.01); G06K 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is an object of the present invention to improve the compression ratio of a color image and to clearly display the outlines of characters and the like. A hue cluster classifying/unifying unit reduces the number of hue values of each pixel in a color image, based on a hue histogram, allocates the number-reduced hue value to each pixel and classifies pixels with the same hue value into one cluster. Furthermore, the unit unifies clusters whose hue values are below a predetermined value. The unit also traces the outline of a cluster whose size is below a reference value and determines that a cluster that has a lot of change points belongs to a character area. An encoding unit determines the characteristic of each cluster, based on both an area determined by an area determining unit and whether the cluster belongs to a ruled line area or a character area, and encodes pixels in each cluster by a coding method suitable for the characteristic of the cluster.


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