The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Feb. 05, 2007
Applicants:

Mariko Fukushima, Kanagawa-ken, JP;

Hiroyuki Miyahara, Kanagawa-ken, JP;

Inventors:

Mariko Fukushima, Kanagawa-ken, JP;

Hiroyuki Miyahara, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2006.01);
U.S. Cl.
CPC ...
Abstract

Detection information is obtained from captured-image information of an imaging element array. An area is provided in an image capturing region in the imaging element array. In response to the obtained detection information, a pattern is generated which defines a ratio of a number of photosensor pixels used to capture an image to a number of all photosensor pixels in the area. The imaging element array is driven in accordance with the generated pattern. Interpolation responsive to a first picture signal generated by the used photosensor pixels in the area is implemented to generate a second picture signal corresponding to unused ones among all the photosensor pixels in the area. The first picture signal and the second picture signal are combined into a captured-image signal. The captured-image signal is outputted at a prescribed frame rate.


Find Patent Forward Citations

Fukushima, Mariko. (2010). Method and apparatus for taking pictures (U.S. Patent No. 7728900). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7728900

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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