The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Apr. 27, 2006
Won Sang Park, Gyeonggi-do, KR;
Kee Han Uh, Gyeonggi-do, KR;
Hae Young Yun, Gyeonggi-do, KR;
Jae Ik Lim, Gangwon-do, KR;
Seung Kyu Lee, Gyeonggi-do, KR;
Sung Eun Cha, Gyeongsangnam-do, KR;
Young Joo Chang, Gyeonggi-do, KR;
Jae Young Lee, Gyeonggi-do, KR;
Sang Woo Kim, Gyeonggi-do, KR;
Won Sang Park, Gyeonggi-do, KR;
Kee Han Uh, Gyeonggi-do, KR;
Hae Young Yun, Gyeonggi-do, KR;
Jae Ik Lim, Gangwon-do, KR;
Seung Kyu Lee, Gyeonggi-do, KR;
Sung Eun Cha, Gyeongsangnam-do, KR;
Young Joo Chang, Gyeonggi-do, KR;
Jae Young Lee, Gyeonggi-do, KR;
Sang Woo Kim, Gyeonggi-do, KR;
Abstract
Disclosed is a picture quality testing apparatus and method of a liquid crystal display which can measure at least any one of gray inversion and color shift. An apparatus for testing the picture quality of a liquid crystal display includes a liquid crystal display for displaying a test pattern, an image pickup device for photographing the test pattern of the liquid crystal display, a measurer for measuring the transmittance of the test pattern photographed by the image pickup device, and a rotating means for rotating at least one of the liquid crystal display and the image pickup device while the image pickup device photographs the test pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile