The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

May. 25, 2006
Applicants:

Masashi Yamasaki, Nagoya, JP;

Hideki Kabune, Nagoya, JP;

Toshiro Nishimura, Kariya, JP;

Inventors:

Masashi Yamasaki, Nagoya, JP;

Hideki Kabune, Nagoya, JP;

Toshiro Nishimura, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of inspecting an electronic circuit that includes a first integrated circuit and a second integrated circuit formed on a circuit board. The first integrated circuit has a first power source, and an input circuit that has a test signal output section and the second integrated circuit has a second power source and an output circuit that has a signal input section. The method includes steps of: turning on the first and second power sources at prescribed voltage levels; changing voltage level of the first power source; applying a test signal to the signal input section of the second integrated circuit; detecting an output signal of the signal output section of the first integrated circuit; and examining whether there is a sufficient margin in the electronic circuit by comparing the test signal and the output signal.


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